NCR: A Self-scaling, Self-calibrated Metric for IDDQ Outlier Identification

IDDQ testing is an important component of a test suite. However, increasing leakage current values with each technology node render single pass/fail limit setting approach obsolete. This is further worsened due to increasing process variations and discriminating faulty and fault-free chips is becoming increasingly difficult. In this paper we evaluate a metric that uses wafer-level spatial information to identify faulty dice on a wafer. The metric is evaluated using industrial test data.